Focused Ion Beam (FIB): An Expert Insight
The Focused Ion Beam (FIB) technology represents a breakthrough tool in precision imaging, patterning, and analysis, becoming an invaluable asset in fields such as materials science, semiconductor fabrication, and nanotechnology. Using a tightly focused beam of ions, typically gallium, FIB systems allow users to etch, mill, deposit, or analyze materials with extreme precision. This technique...
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